90314100 -- For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
87042191 ----- New
76051100 -- Of which the maximum cross-sectional dimension exceeds 7?mm
68128010 -- Fabricated fibres; mixtures with a basis of asbestos or with a basis of asbestos and magnesium carbonate
87021099 --- Used
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